X-Rite Launches Its CiF3200 Imaging Benchtop Spectrophotometer

X-Rite Incorporated announced the launch of the CiF3200 imaging spectrophotometer, designed for color measurement of small, odd-shaped, multi-colored, and highly reflective items.

With a minimum measurement area of just 2mm, the CiF3200 allows manufacturers to set and communicate digital color standards for small components, improving quality control and reducing rework. It’s ideal for applications where detail, consistency, and accuracy are essential, such as luxury goods, consumer electronics, and plastic components.

The CiF3200 combines advanced features such as virtual apertures ranging from 2–12mm, on-screen targeting for precise sample alignment, and automatic multi-color extraction to deliver fast, repeatable color measurements and support objective, data-driven evaluation.

The CiF3200 sphere benchtop spectrophotometer offers simultaneous SPIN / SPEX capability. It enables brilliance measurement, which is critical for quality control on metals and materials that may exhibit visual variation due to surface finishing and metallic reflection. Whether maintaining color harmony for luxury watches or verifying part-to-part consistency on small, molded goods, the CiF3200 helps manufacturers elevate quality assurance with confidence and efficiency.

“With the CiF3200, we’re addressing a unique need in the industry – how to consistently measure color on small or oddly shaped parts,” said Dave Visnovsky, product manager, X-Rite. “By combining advanced targeting and imaging with sphere measurement technology and an aperture as small as 2mm, the CiF3200 allows customers to digitize their standards and streamline quality control in ways that simply weren’t possible before.”