04.14.09
Fischer Technology offers
coatings thickness gauges
Fischer Technology offers a complete range of hand held coating thickness gauges suitable for measurements of paint, powder coating, plating and anodize. These gauges measure over ferrous, non-ferrous or both ferrous and non-ferrous substrates. The FMP series is the most recent addition to the Fischer product line. The new instruments are the Dualscope FMP20, Deltascope FMP30, Iso-Scope FMP30, Dualscope FMP40 and Dualscope FMP100 coating thickness gauges. These easy to use and versatile instruments offer a large and bright graphic display with an extremely durable shock resistant casing, according to the company. A large selection of probes are interchangeable for the new FMP Series yielding accuracy and a wide measurement range. In addition to the FMP series, Fischer offers the MP0R series which has two large displays, automatic substrate recognition. More info: Fischer Technology, (860) 683-0781; E-mail: info@fischer-technology.com; Web: www.fischer-technology.com.
coatings thickness gauges
Fischer Technology offers a complete range of hand held coating thickness gauges suitable for measurements of paint, powder coating, plating and anodize. These gauges measure over ferrous, non-ferrous or both ferrous and non-ferrous substrates. The FMP series is the most recent addition to the Fischer product line. The new instruments are the Dualscope FMP20, Deltascope FMP30, Iso-Scope FMP30, Dualscope FMP40 and Dualscope FMP100 coating thickness gauges. These easy to use and versatile instruments offer a large and bright graphic display with an extremely durable shock resistant casing, according to the company. A large selection of probes are interchangeable for the new FMP Series yielding accuracy and a wide measurement range. In addition to the FMP series, Fischer offers the MP0R series which has two large displays, automatic substrate recognition. More info: Fischer Technology, (860) 683-0781; E-mail: info@fischer-technology.com; Web: www.fischer-technology.com.